The GUT-6000B is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000B contains high-end features such as auto-search and loop testing. Automated processes provide an intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load protection mechanisms make the GUT-6000A close to maintenance-free, releasing users from unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL and CMOS, providing a one-size fits-all solution for an IC testing bench area
※ Loop Test
※ Auto-Search
※ Seif-Diagnosis
※ Over-Load Protection
※ Measures 1800 Kinds of Device
※ 54/74 Series TTL
※ 4000 and 4500 Series CMOS
※ Test Socket: 28 Pin
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